VIJAYAPRABHUVEL RAJAVEL. Novel Machine Learning Approach for Defect Detection in DFT Processes. American Scientific Research Journal for Engineering, Technology, and Sciences, Jordan, v. 101, n. 1, p. 325–334, 2025. Disponível em: https://www.asrjetsjournal.org/American_Scientific_Journal/article/view/11608. Acesso em: 22 sep. 2025.